Analysis of Fluorine Traces in TiO2 Nanoplatelets by SEM/EDX, AES and TOF-SIMS
نویسندگان
چکیده
منابع مشابه
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The surface properties of polymer blends are important for many industrial applications. The physical and chemical properties at the surface of polymer blends can be drastically different from those in the bulk due to the surface segregation of the low surface energy component. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary mass spectrometry (ToF-SIMS) have been widely used...
متن کاملApplied to TOF-SIMS Data
1 Vienna University of Technology, Institute of Chemical Engineering Laboratory for Chemometrics, Getreidemarkt 9/166, A-1060 Vienna, Austria [email protected], www.lcm.tuwien.ac.at 2 Vienna University of Technology, Institute of Statistics and Probability Theory Wiedner Hauptstrasse 8-10, A-1040 Vienna, Austria [email protected], www.statistik.tuwien.ac.at/public/filz 3 Max Pl...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2017
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927617010200